| Item | Specification | BS-6023B | BS-6023BD |
| Optical System | Infinite optical system | ● | ● |
| Viewing Head | Siedentopf trinocular viewing head, inclined at 30°, rotate360° interpupillarty distance 48mm-75mm, light distribution: 80:20 | ● | ● |
| Eyepiece | Extral wide field eyepiece EW10×/22, eyepiece tube Φ30mm | ● | |
| Infinite Plan Achromatic Objective | 5×/ 0.12/∞/ - (BF) WD 15.5mm | ● | |
| 10×/ 0.25/∞/ - (BF) WD 10.0mm | ● | ||
| 20×/ 0.4/∞/ 0 (BF) WD 5.8mm | ● | ||
| 50×/ 0.75/∞/ 0 (BF) WD 0.32mm | ● | ||
| 100×/ 0.8/∞/ 0 (BF) WD 2.0mm | ● | ||
| 5×/ 0.12/∞/ - (BF&DF) WD 12.0mm | ● | ||
| 10×/ 0.25/∞/ - (BF&DF) WD 10.0mm | ● | ||
| 20×/ 0.4/∞/ 0 (BF&DF) WD 4.3mm | ● | ||
| 50×/ 0.75/∞/ 0 (BF&DF) WD 0.32mm | ● | ||
| 100×/ 0.8/∞/ 0 (BF&DF) WD 2.0mm | ● | ||
| DIC | DIC Attachment 20×, 100× | ○ | ○ |
| Reflected Light | 24V/100W Halogen light, Brightness adjustable | ● | ● |
| 150W Cold Light, Brightness adjustable | ○ | ○ | |
| 40W LED illumination, Brightness adjustable | ○ | ○ | |
| Polarizer and analyzer | ○ | ○ | |
| Blue, Green, Yellow and Frosted filter | ● | ● | |
| Focusing | Coaxial coarse and fine adjustment, Fine Division 0.001mm, Moving Range 32mm | ● | ● |
| Nosepiece | Backward quintuple nosepiece | ● | ● |
| Stand | Size of the base: 396×276mm×22mm, the height of the column 300mm, diameter 30mm | ● | ● |
| Accessories | Specimen Presser | ○ | ○ |
| Photo Attachment for Nikon or Canon DSLR camera | ○ | ○ | |
| Video Attachment, C-Mount 1×, 0.5× | ○ | ○ |
BS-6023B
4. Comfortable and Easy to Use.
(1) NIS45 Infinite Plan Semi-APO and APO Objectives. With high transparent glass and advanced coating technology, NIS45 objective lens can provide high resolution images and accurately reproduce the natural color of the specimens. For special applications, a variety of objectives is available, including polarizing and long working distance.
(2) Nomarski DIC. With newly designed DIC module, the height difference of a specimen which can not be detected with brightfield becomes a relief-like or 3D image. It is ideal for the observation of LCD conducting particles and the surface scratches of hard-disk etc.
(3) Focusing System. In order to make the system suitable for the operating habits of the operators, the knob of focusing and stage can be adjusted to the left-hand side or right-hand side. This design makes the operation more comfortable.
(4) Ergo Tilting Trinocular Head. Eyepiece tube can be adjustable from 0 ° to 35 °，Trinocular tube can be connected to DSLR camera and digital camera, having a 3-postion beam splitter (0:100, 100:0, 80:20), the splitter bar can be assembled on the either side according to user's requirement. 5. Various Observation Methods.
Darkfield (Wafer) Darkfield enables the observation of scattered or diffracted light from the specimen. Anything that is not flat reflects this light while anything that is flat appears dark so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level-smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a specimen and examining mirror surface specimens, including wafers.Differential Interference Contrast (Conducting Particles) DIC is a microscopic observation technique in which the height difference of a specimen not detectable with brightfield becomes a relief-like or three- dimensional image with improved contrast. This technique utilizes polarized light and can be customized with a choice of three specially designed prisms. It is ideal for examining specimens with very minute height differences, including metallurgical structures, minerals, magnetic heads, hard-disk media and polished wafer surfaces.
Transmitted Light Observation (LCD) For transparent specimen such as LCDs, plastics, and glass materials, transmitted light observation is available by using a variety of condensers. Examining specimen in transmitted brightfield and polarized light can be accomplished all in one convenient system.Polarized Light (Asbestos) This microscopic observation technique utilizes polarized light generated by a set of filters (analyzer and polarizer). The characteristics of the sample directly affect the intensity of the light reflected through the system. It is suitable for metallurgical structures (i.e., growth pattern of graphite on nodular casting iron), minerals, LCDs and semiconductor materials.